A physics-based electro-thermal model for FS IGBT

A robust electro-thermal IGBT SPICE model: Application to short-circuit protection circuit design

Novel Electro-Thermal Coupling Simulation Technique for Dynamic Analysis of HV (Hybrid Vehicle) Inverter

This paper describes a novel electro-thermal coupling simulation technique mainly focused on the dynamic analysis of the HV inverter during WOT (Wide Open Throttle) operation. This technique can predict the junction temperature of power devices installed within the power module accurately. This simulation technique is composed of an inverter circuit model including power semiconductor device mo...

Parameter Extraction for a Physics-Based Circuit Simulator IGBT Module

A practical parameter extraction method is presented for the Fourier-based-solution physics-based IGBT model. In the extraction procedure, only one simple clamped inductive load test is needed for the extraction of the eleven and thirteen parameters required for the NPT and PT IGBT models, respectively. Validation with experimental results from various structure IGBTs demonstrates the accuracy ...

Large-Signal Microwave Characterization of AlGaAs/GaAs HBTs based on a Physics-Based Electro-Thermal Model

A physics-based multi-cell electro-thermal equivalent circuit model is described which is applied to the large-signal microwave characterization of AlGaAs/GaAs HBTs. This highly efficient model, which incorporates a new multi-finger electro-thermal model, has been used to perform DC, small-signal and load-pull characterization and investigate parameter-spreads due to fabrication process variati...

Comparison of High Power IGBT, IGCT and ETO for Pulse Applications

This paper focuses on the comparison of the state-ofthe-art high power devices. A behavioral power loss model is developed to conduct electro-thermal simulation of these devices. The junction temperature is observed through simulation. The high power devices are compared for pulse application based on losses and thermal handling capability. Moreover, device operation condition (current, voltage...